Surface Roughness / Contour Measuring Instrument. Easy operation by Touch Panel. For various kind of sample.
Measuring range / Verticala resolution | Z: 600 μm / 0.08 nm |
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Drive speed | 0.05-2mm/s |
Stylus | R2 μm 0.75 mN or Less |
Accuracy | Z: ±0.25 % (Our Standard) X: ±(1+0.02L) μm or Less L: Measuring Length(mm) |
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Measuring range | Z: 50 mm X: 100 mm |
Stylus | R25 μm 10-30 mN |
Portable type Measuring lnstrument. Surface profile can be displayed in real time.
Measuring range / Verticala resolution | Z: 800 μm / 0.08 nm |
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Drive speed | 0.05-2mm/s |
Stylus | R2 μm 0.75 mN or Less |
Accuracy | Z: ±(2.5+0.5×|H|) μm or Less H: Displacement(mm) X: ±(2.5+0.02L) μm or Less L: Measuring Length(mm) |
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Measuring range | Z: 30 mm X: 510 mm |
Stylus | R25 μm 10-30 mN |
SEF680 is a combination unit with surface roughness and form contour measuring instrument, able to evaluate roughness, waviness and contour profiles.
Parameters | 46 |
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Measuring range | Z: 600 μm X: 100 mm |
Stylus | R2 μm 0.7 mN |
Analysis item | Element / Scalar / Ball screw, etc |
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Measuring range | Z: 50 mm X: 100 mm |
Stylus | R25 μm 30 mN or less |
SE680K31 is a reasonable combination unit with 2D and 3D roughness and form contour measuring instrument.
Standards | JIS(2001/94/82), DIN, ISO, ASME |
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Measuring range | Z: 600 μm X: 100 mm |
Measuring magnification | Z: 50-500,000 X: 1-5,000 |
Recording | Recordable in free layout |
Stylus | R2 μm, 0.7 mN |
Measuring range | Z: 600 μm X: 100 mm Y: 50 mm |
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Minimum sampling pitch | 1 μm for X and Y |
Recording | Color recording (bird’s eye view, differential contour, etc.), particle analysis, 3D roughness parameter analysis, etc |
Stylus | R2 μm 0.7 mN |
Analysis item | Element / scalar / ball screw, etc |
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Measuring range | Z: 50 mm X: 100 mm |
Stylus | R25 μm 30 mN or less |