Roughness and Contour Measuring Instrument｜Precision Measuring Instruments

Surface Roughness / Contour Measuring Instrument. Easy operation by Touch Panel. For various kind of sample.

Surface Roughness
- Analysis : Many parameters of different standards in one measurement.(Roughness measurement)
Contour
- High resolution (Max. Sampling points : 64,000 points) and long measuring distance.

Measuring range / Verticala resolution	Z: 600 μm / 0.08 nm
Drive speed	0.02-10mm/s
Stylus	R2 μm 0.75 mN or Less

Accuracy	Z: ±0.25 % (Our Standard) X: ±(1+0.02L) μm or Less L: Measuring Length(mm)
Measuring range	Z: 50 mm X: 100 mm
Stylus	R25 μm 10-30 mN

Portable type Measuring lnstrument. Surface profile can be displayed in real time.

Surface Roughness
- The unit can output the parameters based on multiple standards just a time.(Roughness Measurement)
Contour
- High resolution (Max. Sampling points : 64,000 points) and long measuring distance.

Measuring range / Verticala resolution	Z: 800 μm / 0.08 nm
Drive speed	0.05-2mm/s
Stylus	R2 μm 0.75 mN or Less

Accuracy	Z: ±(2.5+0.5×｜H｜) μm or Less H: Displacement(mm) X: ±(2.5+0.02L) μm or Less L: Measuring Length(mm)
Measuring range	Z: 30 mm X: 510 mm
Stylus	R25 μm 10-30 mN

Digital Contour & Roughness measuring instrument that enables measurement of a wide dynamic range with high resolution.

In wide dynamic range in high resolving power by digital sensor, enables the simultaneous measurement of contour & surface roughness in wide range.
Detector with collision detection function is standard equipment.

Measuring range / Verticala resolution	0.75nm / ±6mm
Detection method	Semiconductor laser scale
Stylus	R2 μm 0.7 mN
Analysis item	Form Analysis (Element Analysis, The scalar analysis, Statistical analysis, Master comparison analysis, Tolerance judgement) Surface roughness (JIS、ISO、DIN、ANSI、BS) Surface waviness (JIS)

Model Lineup