Gathering the features both Surface roughness and Form contour measuring instruments, we would introduce combination measuring unit.

Kosaka Laboratory Ltd.

Roughness and Contour Measuring Instrument  SURFCORDER

Model lineup

SEF580-G18/-G18D

Roughness and Contour Measuring Instrument / SEF580-G18/-G18D

PDF catalog

Surface Roughness / Contour Measuring Instrument. Easy operation by Touch Panel. For various kind of sample.

Surface Roughness
Analysis : Many parameters of different standards in one measurement.(Roughness measurement)
Contour
High resolution (Max. Sampling points : 64,000 points) and long measuring distance.
Surface roughness
Measuring range / Verticala resolution Z: 600 μm / 0.08 nm
Drive speed 0.05-2mm/s
Stylus R2 μm  0.75 mN or Less
Contour
Accuracy Z: ±0.25 % (Our Standard)  X: ±(1+0.02L) μm or Less
L: Measuring Length(mm)
Measuring range Z: 50 mm  X: 100 mm
Stylus R25 μm  10-30 mN
SEF580-M50/-M58/-M58D

Roughness and Contour Measuring Instrument / SEF580-M50/-M58/-M58D

PDF catalog

Portable type Measuring lnstrument. Surface profile can be displayed in real time.

Surface Roughness
The unit can output the parameters based on multiple standards just a time.(Roughness Measurement)
Contour
High resolution (Max. Sampling points : 64,000 points) and long measuring distance.
Surface roughness
Measuring range / Verticala resolution Z: 800 μm / 0.08 nm
Drive speed 0.05-2mm/s
Stylus R2 μm  0.75 mN or Less
Contour
Accuracy Z: ±(2.5+0.5×｜H｜) μm or Less  H: Displacement(mm)
X: ±(2.5+0.02L) μm or Less  L: Measuring Length(mm)
Measuring range Z: 30 mm  X: 510 mm
Stylus R25 μm  10-30 mN
SEF680

Roughness and Contour Measuring Instrument / SEF680

SEF680 PDF catalog

SEF680 is a combination unit with surface roughness and form contour measuring instrument, able to evaluate roughness, waviness and contour profiles.

Surface roughness measurement
Complied to worldwide Standards
Automatic Z and X axis calibration function
Auto performance measurement through printing
Contour measurement
Multi-cross sectional contour analysis
One key operation-system powerful macro function
Operation support
Surface roughness
Parameters 46
Measuring range Z: 600 μm  X: 100 mm
Stylus R2 μm  0.7 mN
Contour
Analysis item Element / Scalar / Ball screw, etc
Measuring range Z: 50 mm  X: 100 mm
Stylus R25 μm  30 mN or less
SE680K31

Roughness and Contour Measuring Instrument / SE680K31

SE680K31 PDF catalog

SE680K31 is a reasonable combination unit with 2D and 3D roughness and form contour measuring instrument.

2D roughness measurement
Compatible with various parameters
Automatically performing measurement through printing
Free layout of data chart
3D roughness measurement
Parallel processing of data collection and analysis
Recording bird’s-eye view or a differential contour
Max. 100 million sampling points with high resolution
Contour measurement
Fully satisfied software function is supplied, such auto ball screw analysis, stylus radius correction, and so on.
Free layout of data chart
2D roughness
Standards JIS(2001/94/82), DIN, ISO, ASME
Measuring range Z: 600 μm  X: 100 mm
Measuring magnification Z: 50-500,000  X: 1-5,000
Recording Recordable in free layout
Stylus R2 μm, 0.7 mN
3D roughness
Measuring range Z: 600 μm  X: 100 mm  Y: 50 mm
Minimum sampling pitch 1 μm for X and Y
Recording Color recording (bird’s eye view, differential contour, etc.), particle analysis, 3D roughness parameter analysis, etc
Stylus R2 μm  0.7 mN
Form contour
Analysis item Element / scalar / ball screw, etc
Measuring range Z: 50 mm  X: 100 mm
Stylus R25 μm  30 mN or less

Accessory list