Roughness and Contour Measuring Instrument SURFCORDER
Model lineup
SEF580-G18/-G18D
Surface Roughness / Contour Measuring Instrument. Easy operation by Touch Panel. For various kind of sample.
- Surface Roughness
- Analysis : Many parameters of different standards in one measurement.(Roughness measurement)
- Contour
- High resolution (Max. Sampling points : 64,000 points) and long measuring distance.
| Measuring range / Verticala resolution | Z: 600 μm / 0.08 nm |
|---|---|
| Drive speed | 0.05-2mm/s |
| Stylus | R2 μm 0.75 mN or Less |
| Accuracy | Z: ±0.25 % (Our Standard) X: ±(1+0.02L) μm or Less L: Measuring Length(mm) |
|---|---|
| Measuring range | Z: 50 mm X: 100 mm |
| Stylus | R25 μm 10-30 mN |
SEF580-M50/-M58/-M58D
Portable type Measuring lnstrument. Surface profile can be displayed in real time.
- Surface Roughness
- The unit can output the parameters based on multiple standards just a time.(Roughness Measurement)
- Contour
- High resolution (Max. Sampling points : 64,000 points) and long measuring distance.
| Measuring range / Verticala resolution | Z: 800 μm / 0.08 nm |
|---|---|
| Drive speed | 0.05-2mm/s |
| Stylus | R2 μm 0.75 mN or Less |
| Accuracy | Z: ±(2.5+0.5×｜H｜) μm or Less H: Displacement(mm) X: ±(2.5+0.02L) μm or Less L: Measuring Length(mm) |
|---|---|
| Measuring range | Z: 30 mm X: 510 mm |
| Stylus | R25 μm 10-30 mN |
SEF3500
SEF3500 is a combination unit with surface roughness and form contour measuring instrument, able to evaluate roughness, waviness and contour profiles.
- Surface roughness measurement
- Complied to worldwide Standards
- Automatic Z and X axis calibration function
- Auto performance measurement through printing
- Contour measurement
- Multi-cross sectional contour analysis
- One key operation-system powerful macro function
- Operation support
| Parameters | 46 |
|---|---|
| Measuring range | Z: 600 μm X: 100 mm |
| Stylus | R2 μm 0.7 mN |
| Analysis item | Element / Scalar / Ball screw, etc |
|---|---|
| Measuring range | Z: 50 mm X: 100 mm |
| Stylus | R25 μm 30 mN or less |
SEF3500K
SEF3500K is a reasonable combination unit with 2D and 3D roughness and form contour measuring instrument.
- 2D roughness measurement
- Compatible with various parameters
- Automatically performing measurement through printing
- Free layout of data chart
- 3D roughness measurement
- Parallel processing of data collection and analysis
- Recording bird’s-eye view or a differential contour
- Max. 100 million sampling points with high resolution
- Contour measurement
- Fully satisfied software function is supplied, such auto ball screw analysis, stylus radius correction, and so on.
- Free layout of data chart
| Standards | JIS(2001/94/82), DIN, ISO, ASME |
|---|---|
| Measuring range | Z: 600 μm X: 100 mm |
| Measuring magnification | Z: 50-500,000 X: 1-5,000 |
| Recording | Recordable in free layout |
| Stylus | R2 μm, 0.7 mN |
| Measuring range | Z: 600 μm X: 100 mm Y: 50 mm |
|---|---|
| Minimum sampling pitch | 1 μm for X and Y |
| Recording | Color recording (bird’s eye view, differential contour, etc.), particle analysis, 3D roughness parameter analysis, etc |
| Stylus | R2 μm 0.7 mN |
| Analysis item | Element / scalar / ball screw, etc |
|---|---|
| Measuring range | Z: 50 mm X: 100 mm |
| Stylus | R25 μm 30 mN or less |
Accessory list
- Pick-up / C series
- Pick-up / D series
- Interchangeable stylus for roughness pick-ups
- Non-contact pick-up (PU-OS400)
- Circumferential roughness measuring unit (SRA-21)
- Circumferential roughness measuring system (ZRM-200)
- Universal stage (RAF-11)
- Y-axis motorized stage (RAF-22D)
- XY axis stage (RAF-31)
- Workpiece stage (RAG)
- Rotary motorized stage (RAP-12D)
- Leveling stage (ST series)
- Stylus arms for contour