SE300 is a portable high-performance surface roughness and waviness measuring instrument, characterized by skidless measurement, built-in high resolute printer, memory for 5 measurement conditions, Cross over the 2 Standards analysis function.
Parameters | 63 parameters such Ra, Rp and Rz |
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Measurement range / resolution | Z: 800 μm / 0.0064 μm |
Max. measured length | X: 25 mm |
Measuring magnification | Z: 100 to 100,000 or Auto X: 1 to 1,000 |
Pick-up | interchangeable stylus Standard stylus: R2 μm , 60ツー |
Power supply | AC adaptor |
SE500 is sophisticated, compact design and high performance model for surface roughness, waviness and steps. Compatible with various parameters and perform simultaneous analysis of multiple Standards. Excellent expandable unit to meet all applications.
Standards | JIS(2001/94/82), DIN, ISO, ASME |
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Measuring range | Z: 800 μm X: 55 mm |
Minimum resolution | 0.08 nm |
Measuring magnification | Z: 50-200,000 or Auto  X: 1-1000 or Auto |
Measuring speed | 0.05-2 mm/s |
Combinations | 7 models from portable type to stationary type |
SE600 is complied to worldwide standards including ISO, JIS, DIN, ASME and BS, and each old and current standards. Various filters, cutoff values, measuring length and formula types are provided to meet the standards.
Standards | JIS(2001/94/82), DIN, ISO, ASME, etc |
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Measuring range | Z: 600 μm X: 100 mm |
Measuring magnification | Z: 50-500,000 X: 1-5,000 |
Measuring speed | 0.05-2 mm/s |
Z traverse range | 250 mm |
Recording | Free layout |
3D surface roughness measuring function is added to SE3500 to enable deep evaluation of a target surface with respect to a line and a plane.
Standards | JIS(2001/94/82), DIN, ISO, ASME, etc |
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Measuring range | Z: 600 μm X: 100 mm |
Measuring magnification | Z: 50-500,000 X: 1-5,000 |
Recording | Recordable in free layout |
Measuring range | Z: 600 μm X: 100 mm Y: 50 mm |
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Minimum sampling pitch | 1 μm for X and Y |
Recording | Color recording (bird's eye view, differential contour, etc.), particle analysis, 3D roughness parameter analysis, etc |
SE700 is a high-performance surface roughness measuring instrument, upgrated to quick motion, inch size-response driving stroke and higher analysis capabilities.
Measurement range | Z: 800 μm X: 120 mm |
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Sampling points / resolution | Max. 32,000 points / 16 bits |
Straightness | 0.2 μm / 120 mm |
Measuring magnification | Z: 50-500,000 X: 1-5,000 |
Measuring speed | 0.05-5 mm/s |
Z traverse range | 320 mm |
SE4000 is stage traverse type with stable straightness, to measure the precision small components.
Standards | JIS(2001/94/82), DIN, ISO, ASME, etc |
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Measuring range | Z: 600 μm X: 100 mm |
Measuring magnification | Z: 50-500,000 X: 1-5,000 |
Measuring speed | 0.05-2 mm/s |
Recording | Recordable in free layout |