We would introduce hybrid contour and roughness measuring instruments able to detect roughness and waviness buried in contour profile.

Kosaka Laboratory Ltd.

Hybrid Contour and Roughness Measuring Instrument  SURFCORDER

Model Lineup

DSF600

By 1 scanning, contour and roughness or waviness are able to be gained

  • High resolution and wide dynamic range
  • Suitable for complex-shape precision components
Z resolution / measuring range 0.0075 μm / 5 mm  0.012 μm / 8 mm
Stylus R2 μm / 0.75 mN / 60 °  R25 μm / 10 mN / 25°
Analysis item Contour (element, scalar, statistics, tolerance judge)
Roughness (JIS, ISO, DIN, ANSI, BS)
Waviness (JIS)
DSF900

DSF900 is a digital contour and roughness measuring instrument to achieve wide dynamic range measurements with high accuracy.

  • Various parameters of surface roughness or waviness and various contour are analyzable.
Z resolution / measuring range 0.00075 μm / ±6 mm (0.0015 μm / ±12 mm)
Z detection method Semiconductor laser scale
Stylus R2 μm / 0.75 mN / 60°  R25 μm / 10 mN / 25°
Analysis item Contour (element, scalar, statistics, master comparison, tolerance judge)
Roughness (JIS, ISO, DIN, ANSI, BS)
Waviness (JIS)

Accessory list